DSP28335用XDS100v2连接不上，什么问题？

nuiga

刚接触DSP28335，CCS5.3编程环境，XDS100v2下载器，同样的程序和配置连接下载一个老板没有问题，现在项目需要用了一个新板，但是连接测试错误，错误信息如下，求高手指教。
[Start]
4 H2 ?* k3 z( ]/ r) Q
1 U. G( F! t  u7 k0 X4 @9 G3 i9 FExecute the command:

. ~* f+ i( K7 H%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity

[Result]
% Y+ w: F% f, Z4 E* k  T; f

-----[Print the board config pathname(s)]------------------------------------
* O1 f. G; k( C) H* M& {' l9 P
C:\Users\ADMINI~1\AppData\Local\.ti\4084209646\
    0\0\BrdDat\testBoard.dat

- I% v! ]$ A7 n9 {8 _2 t" E' A; l-----[Print the reset-command software log-file]-----------------------------

$ i- [2 C$ `3 _- TThis utility has selected a 100- or 510-class product.
4 _. ?. ?/ H& L$ H: `* s2 }! KThis utility will load the adapter 'jioserdesusb.dll'.
The library build date was 'Oct  3 2012'.
The library build time was '21:58:41'.
/ H. i: i( h- Q0 z. Z( J' j( qThe library package version is '5.0.872.0'.
6 Y8 s2 z& z+ ?0 C# YThe library component version is '35.34.40.0'.
The controller does not use a programmable FPGA.
: R( w1 I2 Y0 X3 D* e  n1 R/ }! SThe controller has a version number of '4' (0x00000004).
0 y: q& e& q  b  m" R/ O/ Q- }The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.

-----[Print the reset-command hardware log-file]-----------------------------
, o: I' m7 w# z# l1 i) Y5 e
The scan-path will be reset by toggling the JTAG TRST signal.
. j; r1 G, d9 ZThe controller is the FTDI FT2232 with USB inteRFace.
, S  }* b$ q6 q" q4 w* ^/ wThe link from controller to target is direct (without cable).
" l0 \4 k+ ^9 r- `6 F, SThe software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
0 c  U2 e5 J) SThe controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).
, x: y) v6 G6 v" B: S
: v" R  G: m5 q-----[The log-file for the JTAG TCLK output generated from the PLL]----------

There is no hardware for programming the JTAG TCLK frequency.

8 {+ Y, U! h8 ]-----[Measure the source and frequency of the final JTAG TCLKR input]--------

+ D2 b" m4 m& a6 V+ J8 F3 xThere is no hardware for measuring the JTAG TCLK frequency.

-----[Perform the standard path-length test on the JTAG IR and DR]-----------
" D- A: `* i7 F8 H( t# N+ s
This path-length test uses blocks of 512 32-bit words.
, n7 w: L0 s8 T( s+ _, |
5 p, _' y, X# ~1 v5 M+ lThe test for the JTAG IR instruction path-length faiLED.
The many-ones then many-zeros tested length was 6 bits.
The many-zeros then many-ones tested length was -16352 bits.

! ^9 x6 x2 i8 J( d& qThe test for the JTAG DR bypass path-length failed.
/ u: P- U1 ~: ~5 IThe many-ones then many-zeros tested length was 8 bits.
3 U0 L0 K! }" b) k& gThe many-zeros then many-ones tested length was -16352 bits.
, I5 {3 T0 H+ `1 j" y5 w
-----[Perform the Integrity scan-test on the JTAG IR]------------------------
4 H# [7 ?2 A0 g" j3 ?% d- o
+ l/ Z6 C* F, z, M. j9 RThis test will use blocks of 512 32-bit words.
This test will be applied just once.

0 y0 z3 Z" N; |6 s2 [# A" vDo a test using 0xFFFFFFFF.
) q" o, L! x6 _/ c: }% }Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
) N" ^, `/ r9 |% c& @7 ]( K1 ^& mTest 2 Word 0: scanned out 0x00000000 and scanned in 0x000000FF.
Scan tests: 2, skipped: 0, failed: 1
Do a test using 0xFE03E0E2.
Test 3 Word 0: scanned out 0xFE03E0E2 and scanned in 0xFC1FE7FF.
: U7 O! X: `5 i( U" O0 [% G, gTest 3 Word 1: scanned out 0xFE03E0E2 and scanned in 0xFC1FC7FF.
7 _+ M% r1 x1 l# yTest 3 Word 2: scanned out 0xFE03E0E2 and scanned in 0xFC1FE7FF.
- w  n/ I% \. R2 LTest 3 Word 3: scanned out 0xFE03E0E2 and scanned in 0xFC1FE7EF.
Test 3 Word 4: scanned out 0xFE03E0E2 and scanned in 0xFC1FC7FF.
Test 3 Word 5: scanned out 0xFE03E0E2 and scanned in 0xFC1FC3FF.
. ~7 i7 H$ ^- hTest 3 Word 6: scanned out 0xFE03E0E2 and scanned in 0xFC0FE7FF.
The details of the first 8 errors have been provided.
2 {. m" a* b' y8 C6 yThe utility will now report only the count of failed tests.
Scan tests: 3, skipped: 0, failed: 2
1 R$ n2 @2 u2 rDo a test using 0x01FC1F1D.
; `  v: k$ U. HScan tests: 4, skipped: 0, failed: 3
0 v. {; n0 a5 J$ E  gDo a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 4
4 X2 C9 N0 [+ U1 v5 X  |Do a test using 0xAACC3355.
0 ]& q4 Z0 i: R7 O) E1 u! oScan tests: 6, skipped: 0, failed: 5
# M( m$ P3 l# c- }/ r! [, E# E% N/ uSome of the values were corrupted - 66.7 percent.

: t( Z: f6 M3 s: p  M. \The JTAG IR Integrity scan-test has failed.

-----[Perform the Integrity scan-test on the JTAG DR]------------------------

2 u7 I! I3 c, b5 J: qThis test will use blocks of 512 32-bit words.
This test will be applied just once.
! ?$ A. |" m/ w$ u0 ^7 A/ d. @0 {$ i
Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
% v; X8 s4 w5 `$ ODo a test using 0x00000000.
6 Y- J5 w' M! _/ {Test 2 Word 0: scanned out 0x00000000 and scanned in 0x0000007F.
3 X# o! J6 ]" O6 X% j' Z$ X* WScan tests: 2, skipped: 0, failed: 1
- k& ]. ^7 [: w1 _. \Do a test using 0xFE03E0E2.
" q, Z- h" x# a4 x3 z( xTest 3 Word 0: scanned out 0xFE03E0E2 and scanned in 0xFC1FE7FF.
3 m2 I) f) z6 p5 i6 TTest 3 Word 1: scanned out 0xFE03E0E2 and scanned in 0xFC3FE7FF.
Test 3 Word 2: scanned out 0xFE03E0E2 and scanned in 0xFC0FE7FF.
2 P! @7 C- c" K% i/ V+ A0 CTest 3 Word 3: scanned out 0xFE03E0E2 and scanned in 0xFC3FE7FF.
4 r, i: s& y6 l7 Y; ?Test 3 Word 4: scanned out 0xFE03E0E2 and scanned in 0xFC1FC7FF.
1 W% _) W/ c3 T& l0 T. pTest 3 Word 5: scanned out 0xFE03E0E2 and scanned in 0xFE1FE7FF.
Test 3 Word 6: scanned out 0xFE03E0E2 and scanned in 0xFC1FE7FF.
2 T3 s% n+ K0 ~0 h7 l' }. O! eThe details of the first 8 errors have been provided.
& y, i) i, A1 i1 |& SThe utility will now report only the count of failed tests.
" U8 l2 n. V+ E$ v! Q/ @  ]Scan tests: 3, skipped: 0, failed: 2
: Q$ y8 Y. S8 `9 Q; R3 r* HDo a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 3
0 J& b; R- V& HDo a test using 0x5533CCAA.
; U; ~% }- j% g; T/ I4 qScan tests: 5, skipped: 0, failed: 4
" }" C: v! f7 z% J: Q8 J6 |4 mDo a test using 0xAACC3355.
  d' Z% t$ ^8 A% G  ?) P% ~Scan tests: 6, skipped: 0, failed: 5
Some of the values were corrupted - 66.7 percent.
' b) z7 \5 K  _$ y
: w! `& }6 k0 f, ]3 d8 X8 o& u/ AThe JTAG DR Integrity scan-test has failed.
. t* `6 J; }  B2 c5 |- X

sdsdwwwe22

那你检查一JTAG的各个引脚是否有不能用的

angern

可能是DSP芯片的问题，检查一下jtag周边的电路，看看电阻电容有没有焊接错误

ssdgh

应该是DSP板子的供电出了问题

hunterccc

仿真器类型和型号有没有错