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DSP28335用XDS100v2连接不上,什么问题?

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1#
发表于 2021-12-23 10:34 | 只看该作者 回帖奖励 |倒序浏览 |阅读模式

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刚接触DSP28335,CCS5.3编程环境,XDS100v2下载器,同样的程序和配置连接下载一个老板没有问题,现在项目需要用了一个新板,但是连接测试错误,错误信息如下,求高手指教。
7 s/ O1 H" e% g[Start]) j+ g7 M& |/ J; ]8 i- ~

" M; A! v7 t+ |9 D& \/ p# nExecute the command:+ Q5 V/ z! V. n
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%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity( z- B. G) ~9 Z* X
# j. C7 b! j; E9 f, p5 e7 {1 F
[Result]9 W8 t* a0 s4 D. e
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-----[Print the board config pathname(s)]------------------------------------  G/ ~( }8 r" M$ z, H, ^: D
. c( P7 w  J# o# P) j
C:\Users\ADMINI~1\AppData\Local\.ti\4084209646\
9 x6 U) V" O' X( ]/ l    0\0\BrdDat\testBoard.dat
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-----[Print the reset-command software log-file]-----------------------------
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' D: @1 f( `0 q- lThis utility has selected a 100- or 510-class product.3 `% B6 {/ P" }4 C' p) V
This utility will load the adapter 'jioserdesusb.dll'.; f) x  ~3 P, O9 V4 |1 t
The library build date was 'Oct  3 2012'.
" ?: K" ^# p* y" L! k$ V. ~' @The library build time was '21:58:41'.* O  d. h" G# Y  Q' v! S, `6 ~& P
The library package version is '5.0.872.0'.* N6 `  E! E  I& y
The library component version is '35.34.40.0'.6 V+ a; {* K$ @. J
The controller does not use a programmable FPGA.% t& E& Q) J  f( S
The controller has a version number of '4' (0x00000004).( @$ ~7 r2 d2 H+ u
The controller has an insertion length of '0' (0x00000000)./ N' ^6 @+ i9 d6 w1 D, h  `
This utility will attempt to reset the controller.5 S6 A$ v' U+ Z( }' J! q" [- a
This utility has successfully reset the controller.
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-----[Print the reset-command hardware log-file]-----------------------------
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, i! K8 w) {% V, |. p9 yThe scan-path will be reset by toggling the JTAG TRST signal.
1 U' A$ C1 i5 f2 G* X8 }& j2 t3 nThe controller is the FTDI FT2232 with USB inteRFace.3 P2 k  @, a/ `/ U
The link from controller to target is direct (without cable).4 J' v$ ?* K' h, @- Y3 w3 W
The software is configured for FTDI FT2232 features.
3 ~  h' D% n$ @! eThe controller cannot monitor the value on the EMU[0] pin.
6 E4 s! F2 y) W4 C' sThe controller cannot monitor the value on the EMU[1] pin.. R( ]0 G) Z8 n  r% @
The controller cannot control the timing on output pins.
" p$ f- p' l! p; U& d: K4 KThe controller cannot control the timing on input pins.
7 Q  N- T( |  r" e! I: q: nThe scan-path link-delay has been set to exactly '0' (0x0000).) Y9 N0 w2 w. f3 U' |

! B, R/ l5 V; R+ L-----[The log-file for the JTAG TCLK output generated from the PLL]----------2 J, o8 m  v4 ]' c2 m7 }

% d( F. U0 K5 A* w% ^9 m: ]+ ~There is no hardware for programming the JTAG TCLK frequency.2 \# o0 K) a! ?3 T0 S# O  |8 I

5 C, P) u) y- u  J7 e9 B: Y-----[Measure the source and frequency of the final JTAG TCLKR input]--------8 i: V: }& D9 [- L8 ^# j3 G: w9 D

, ~& C, s. z9 S' x- bThere is no hardware for measuring the JTAG TCLK frequency.7 i9 m* J3 R# a, G; x% Y  @9 w5 P( [1 k

7 B/ g" d- m# ?  g& S* L-----[Perform the standard path-length test on the JTAG IR and DR]-----------0 F& [- k/ ^3 m; r  j$ I
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This path-length test uses blocks of 512 32-bit words.
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The test for the JTAG IR instruction path-length faiLED.
$ R" i3 D0 M7 G1 W) P/ G+ }8 iThe many-ones then many-zeros tested length was 6 bits., z: Z; J" Z2 a7 Y7 E
The many-zeros then many-ones tested length was -16352 bits.
7 x1 A5 m. C  e/ S, m
  {1 E, x# q1 T. h+ z0 `! F* X% ~+ mThe test for the JTAG DR bypass path-length failed.2 A( S# p1 K% |: \
The many-ones then many-zeros tested length was 8 bits.& p+ @! H; X- f; W3 f
The many-zeros then many-ones tested length was -16352 bits.' m- m8 Z5 e, s. u6 g
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-----[Perform the Integrity scan-test on the JTAG IR]------------------------4 M1 A$ U- p) X, w
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This test will use blocks of 512 32-bit words.
3 W4 i& ~3 t  r* d5 [This test will be applied just once.1 w8 E# i- \' r) W0 N  G6 ~: d
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Do a test using 0xFFFFFFFF.8 s, G* k  M2 b6 V1 c/ K7 A
Scan tests: 1, skipped: 0, failed: 0. N; f0 d) o5 ]2 Y/ }+ M
Do a test using 0x00000000.5 Z% h7 E8 x  |( g
Test 2 Word 0: scanned out 0x00000000 and scanned in 0x000000FF.
' ~, \4 _; M- ?# oScan tests: 2, skipped: 0, failed: 19 [" o- @3 u' B# o- l( z. e
Do a test using 0xFE03E0E2.
" {) L$ ^& e- Y- M2 u( [7 vTest 3 Word 0: scanned out 0xFE03E0E2 and scanned in 0xFC1FE7FF.% l& [( {) P" @5 v
Test 3 Word 1: scanned out 0xFE03E0E2 and scanned in 0xFC1FC7FF.3 l6 \3 J2 t3 A3 O: ^1 }4 t* U
Test 3 Word 2: scanned out 0xFE03E0E2 and scanned in 0xFC1FE7FF.7 q' r2 R9 C% g; d# h) z% P
Test 3 Word 3: scanned out 0xFE03E0E2 and scanned in 0xFC1FE7EF.& s) a; p2 Y: \' x
Test 3 Word 4: scanned out 0xFE03E0E2 and scanned in 0xFC1FC7FF.
: _7 j0 [# S8 u5 i' q& e* X  T1 J" i( ?Test 3 Word 5: scanned out 0xFE03E0E2 and scanned in 0xFC1FC3FF.. z& q% K6 Y0 c
Test 3 Word 6: scanned out 0xFE03E0E2 and scanned in 0xFC0FE7FF.
# f$ O& U' x/ O  lThe details of the first 8 errors have been provided.
2 B, V3 F: I4 ^% A6 cThe utility will now report only the count of failed tests.. N& h2 i$ i( U+ w
Scan tests: 3, skipped: 0, failed: 2
/ S# @- U: d: `6 F! U% nDo a test using 0x01FC1F1D.. w) P. ~: z6 s4 d' ?% s
Scan tests: 4, skipped: 0, failed: 3
+ R: [" @( m* ?6 f( `; qDo a test using 0x5533CCAA.4 y, i' T4 e( Z& f* N, s: @
Scan tests: 5, skipped: 0, failed: 4/ k# V  q9 P+ }
Do a test using 0xAACC3355.
- H6 J* T/ y" M8 {Scan tests: 6, skipped: 0, failed: 5/ w7 w+ ?! o6 Z8 ?) x
Some of the values were corrupted - 66.7 percent.1 c) z2 [& ]/ [' q& s. Q
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The JTAG IR Integrity scan-test has failed.
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) S. b' F6 a. B-----[Perform the Integrity scan-test on the JTAG DR]------------------------
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This test will use blocks of 512 32-bit words.  u6 z7 I4 b( ^! I. P
This test will be applied just once.
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Do a test using 0xFFFFFFFF.( D/ {0 Q' O7 R$ l
Scan tests: 1, skipped: 0, failed: 0+ D* {$ _2 g* u( \, F
Do a test using 0x00000000.
  t6 P3 f, i% P: b5 N0 P' KTest 2 Word 0: scanned out 0x00000000 and scanned in 0x0000007F.4 z+ e% V6 Z, m! V
Scan tests: 2, skipped: 0, failed: 1
4 P2 c( ], H  a1 O4 D$ M( U& vDo a test using 0xFE03E0E2.& i1 G( y6 t7 r4 O4 x& Z( q
Test 3 Word 0: scanned out 0xFE03E0E2 and scanned in 0xFC1FE7FF.3 H0 [4 J9 C9 q2 A: m' ~9 M" h
Test 3 Word 1: scanned out 0xFE03E0E2 and scanned in 0xFC3FE7FF.
" Y$ ]& q) M! W8 vTest 3 Word 2: scanned out 0xFE03E0E2 and scanned in 0xFC0FE7FF.
* @% i2 c2 b, h3 F9 nTest 3 Word 3: scanned out 0xFE03E0E2 and scanned in 0xFC3FE7FF.6 Q$ h) r) g& G# p/ Y1 I
Test 3 Word 4: scanned out 0xFE03E0E2 and scanned in 0xFC1FC7FF.
7 Z" ?! s: h8 STest 3 Word 5: scanned out 0xFE03E0E2 and scanned in 0xFE1FE7FF.
+ f& f5 n  w: v( |7 X8 zTest 3 Word 6: scanned out 0xFE03E0E2 and scanned in 0xFC1FE7FF.' j7 E% r! ^& k0 J% f0 F
The details of the first 8 errors have been provided.2 R; v  @8 H9 I; L6 ?: |$ @
The utility will now report only the count of failed tests.! z( K! Z: P3 J/ r+ f
Scan tests: 3, skipped: 0, failed: 25 O; j) u, H5 h3 U
Do a test using 0x01FC1F1D.3 U3 I, A! o- [  D
Scan tests: 4, skipped: 0, failed: 3
% k3 X- P& L2 m' M* f$ p5 HDo a test using 0x5533CCAA., Y' {( N! m- t2 X9 B8 P5 v
Scan tests: 5, skipped: 0, failed: 4
( E1 b# h" |8 R' s0 U: k! C5 ~7 j, YDo a test using 0xAACC3355., A; o/ t/ i4 G# m
Scan tests: 6, skipped: 0, failed: 5
7 a6 A: d* _# V4 @0 l9 CSome of the values were corrupted - 66.7 percent.# e9 n3 ]8 ^( }" g- q

+ k/ W% q2 ~* w3 T4 vThe JTAG DR Integrity scan-test has failed.9 I  F' w" O3 N. J5 `
, X* Z$ |1 C( R: }+ m6 l8 z

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2#
发表于 2021-12-23 11:14 | 只看该作者
那你检查一JTAG的各个引脚是否有不能用的

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3#
发表于 2021-12-23 11:15 | 只看该作者
可能是DSP芯片的问题,检查一下jtag周边的电路,看看电阻电容有没有焊接错误

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4#
发表于 2021-12-23 11:15 | 只看该作者
应该是DSP板子的供电出了问题

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5#
发表于 2021-12-23 11:16 | 只看该作者
仿真器类型和型号有没有错
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