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AGM CPLD Family

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发表于 2019-8-3 09:00 | 只看该作者 |只看大图 回帖奖励 |倒序浏览 |阅读模式

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General Description
; q; \6 ~/ C' V8 V# vAGM cpld family provides low-cost instant-on, non-volatile CPLDs, with densities from 256, 272 to 576 logic LUTs and! U1 `$ k+ K1 U8 L* z( U. u; T
non-volatile flash storage of 256Kbits. The devices offer up to 144 I/O pins featuring with a user flash memory (UFM), and# T  W* C- V( ^  u
in-system programming. The devices are designed to reduce cost and power while providing programmable solutions for a
% Q- M+ E/ C3 b: F, fwide range of applications.
; p% }" H6 k, mFeatures
9 N1 Q+ m$ K5 v7 e2 h/ q  [ Low-Cost and low-power CPLD
2 e  L" ]- F. t$ k Instant-on, non-volatile Compatible FPGA architecture.8 |$ H+ [( u" e; p2 y( g
 Up to 4 global clock lines in the global clock network that drive throughout the entire device.
# ?. n& g2 q' o3 A: O# L! i3 y6 r Provides programmable fast propagation delay and clock-to-output times.& l- I8 r6 k. b# B, {# _6 _1 c
 Provides PLL per device provide clock multiplication and phaseshifting (AG256 has no PLL).; J+ a: ]- S/ Y- b3 o# J. b7 K
 UFM supports non-volatile storage up to 256 Kbits.: \. \& y' ~! L$ \
 Supports 3.3-V, 2.5-V, 1.8-V, and 1.5-V logic level
2 K) _) F9 r0 z& G+ r: S Programmable slew rate, drive strength, bus-hold, programmable pull-up resistors, open-drain output, Schmitt triggers and programmable input delay.
' O7 h- N+ o' ~2 L' j Built-in Joint Test Action Group (JTAG) boundary-scan test (BST) circuitry complaint with IEEE Std. 1149.1-1990
; G& L' o0 {# p. y( E: N) I ISP circuitry compliant with IEEE Std. 1532
7 Q) |, |: Z3 |! Q/ O# v 3.3-V, 2.5-V, 1.8-V, 1.5-V LVCMOS and LVTTL standards6 S5 Y9 k, ?$ k* H
 Emulated LVDS output (LVDS_E_3R)+ w- p* ]- `8 h
 Emulated RSDS output (RSDS_E_3R)3 p  f0 X4 F& y0 U
 Operating junction temperature from -40 to 100 ℃
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% C2 M- P2 J4 }100 or 144 Pins for 256/272/576 LUTs
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