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混合信号测量/ c+ u8 @) @; ? F/ b' X* W
2 ` W+ J3 L( x- h+ U7 ^+ N内容并不限于混合信号系统测试，而是一般芯片或模块测试的全过程，只是以ADC和DAC为例说明芯片外特性测试的全过程。本章更多地是讲测试中的数据处理方法，间或涉及到测试电路
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3 M$ a. y7 p8 F5 W5 y„ I. What is Mixed Signal
9 s' Q! R+ ^( `# u- n# q„ II. Mixed Signal Test Parameters
0 D; m, e( [5 d„ III. Signal Generation
. `& V3 y a6 @. K9 f5 Y, G„ IV. Signal Capture+ M& Q+ P' V) k2 u/ Y+ Q. ^
„ V. Fast Fourier Transform- H& @0 d$ J$ I, B
„ VI. Testing Digital-to-Analog Converters
! z2 Q7 J7 x$ g5 A" B! A„ VII. Testing Analog-to-Digital Converters6 D9 i# T7 D; Q- U1 }2 n+ |
: U4 _0 i) t7 V2 r$ f0 f. V„ Music CD
I9 U, w M$ u) [; W„ Analog information is processed in digital form
7 o h7 c. S4 ]+ z9 e„ Modem- S/ ], c4 z: u" H
„ Digital information is processed in analog form# z _% o, n* F1 z6 t _7 j
„ Mixed Signal System
8 t5 q3 ~4 X7 l9 S0 G7 s* D„ Processes analog information in digital form; or
) l5 `6 g- a1 K @+ V„ Processes digital information in analog form; or4 |" l6 N1 [; c4 \9 l4 ~5 C
„ Both
" E" C/ Q _% R$ f„ Mixed Signal Device+ u! N3 z$ I" t1 x- V
„ Operates across digital and analog domains by representing
' [1 ^/ f C3 k% o8 y: por processing either analog or digital information in either
" p, c+ w) n4 q" i- Y* I. canalog or digital form) {# F8 h! T, a) m3 Q e
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发表于 2019-11-26 15:06
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