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混合信号测量3 j0 Z& H5 U: r7 o9 `
' ~. ~- t" \) `5 P" U2 X" w2 s内容并不限于混合信号系统测试，而是一般芯片或模块测试的全过程，只是以ADC和DAC为例说明芯片外特性测试的全过程。本章更多地是讲测试中的数据处理方法，间或涉及到测试电路
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" K! F. e7 p- b( o4 }„ I. What is Mixed Signal
1 e/ }. ^5 q0 ?% N0 h/ O„ II. Mixed Signal Test Parameters. U1 b' l2 K! W1 w- o. b* t: d
„ III. Signal Generation" w0 H1 f2 s* d' h4 }( f/ u: Z) G
„ IV. Signal Capture
7 X4 g1 S* ~+ ?, a„ V. Fast Fourier Transform! r6 V& L, c7 O, a6 h9 P
„ VI. Testing Digital-to-Analog Converters$ O+ e& \3 l1 b7 V2 o
„ VII. Testing Analog-to-Digital Converters
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- R! s+ W; [4 c„ Music CD
" R' { I6 s" {„ Analog information is processed in digital form( ?& C7 ?+ g; }, S9 l
„ Modem
6 D! }3 b. t, R/ e9 k/ _# X„ Digital information is processed in analog form, O% Z* g/ _: f& Q$ U
„ Mixed Signal System1 K9 T1 l: v- q: Z1 i
„ Processes analog information in digital form; or
* u2 e# g" a X( c„ Processes digital information in analog form; or
6 y, V, e8 _( J' t+ }„ Both- V. Z9 n! F& R2 T- f$ [+ o/ _
„ Mixed Signal Device0 J4 Y" l% c7 h4 h% m
„ Operates across digital and analog domains by representing
]( O/ z, V8 g8 D# c& n& I2 x" Hor processing either analog or digital information in either 1 `: j9 \/ }0 \* f N0 d
analog or digital form
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发表于 2019-11-26 15:06
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