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混合信号测量
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内容并不限于混合信号系统测试，而是一般芯片或模块测试的全过程，只是以ADC和DAC为例说明芯片外特性测试的全过程。本章更多地是讲测试中的数据处理方法，间或涉及到测试电路4 x- z+ h( j4 c& t; G7 ]
$ N+ i; H1 ?, G) E* X+ C' N# i„ I. What is Mixed Signal! W- l' R2 r* D: {
„ II. Mixed Signal Test Parameters2 d' w& C6 T' E/ A7 K( z L( ]
„ III. Signal Generation! K, m1 J2 V/ n2 {
„ IV. Signal Capture
3 _/ o3 O$ V. L/ ?„ V. Fast Fourier Transform
: P- D( b' G6 P P3 K* s„ VI. Testing Digital-to-Analog Converters
9 F' K0 R5 |& F; |) ?6 v: A„ VII. Testing Analog-to-Digital Converters3 r1 o S6 s: K8 J5 e
) Q2 X6 M- O6 c ~+ d„ Music CD
3 }. d* o2 D/ E' p R- p0 _„ Analog information is processed in digital form3 e( z9 G" `) C
„ Modem% S9 L8 _" \& b) O/ o5 }
„ Digital information is processed in analog form/ v, C. B& e* ^' o4 `; _; ^' p
„ Mixed Signal System
" M: ]% m+ U9 _" V" Q" }1 e5 v4 |„ Processes analog information in digital form; or* `- ^/ a. B( c3 ]
„ Processes digital information in analog form; or
$ Y7 b; N3 V' e; l„ Both
) S. m) a* f6 j, N5 }: S Y; M; l„ Mixed Signal Device, {. e9 _& R: G. U
„ Operates across digital and analog domains by representing ' \ r- T& z t3 }7 [
or processing either analog or digital information in either
* H" h3 r. Y4 v( C3 W5 ^analog or digital form
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发表于 2019-11-26 15:06
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