混合信号测量

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混合信号测量
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  o# n, g, Y; ?内容并不限于混合信号系统测试，而是一般芯片或模块测试的全过程，只是以ADC和DAC为例说明芯片外特性测试的全过程。本章更多地是讲测试中的数据处理方法，间或涉及到测试电路

; r6 ~( s8 A% u" l" N8 {+ z„ I. What is Mixed Signal
$ P* k8 _3 D1 b2 a8 s# s„ II. Mixed Signal Test Parameters
„ III. Signal Generation
+ k, n2 b6 r. Z. {' S+ m. {9 v  V4 P5 ^„ IV. Signal Capture
5 ~; Q6 L5 _3 {. G8 H„ V. Fast Fourier Transform
4 v' Z% ]. a% {* p) m% o„ VI. Testing Digital-to-Analog Converters
" N: |! U: P2 R" S  {„ VII. Testing Analog-to-Digital Converters

1 C: \! V  g7 x. }6 ?7 [6 b„ Music CD
0 i- R, m' _3 e2 X7 W„ Analog information is processed in digital form
2 @5 t( k8 L! f; m+ v: [5 p$ S„ Modem
( |) _9 d  h+ \$ a„ Digital information is processed in analog form
„ Mixed Signal System
" x) M' _1 C  I; g, N8 T„ Processes analog information in digital form; or
„ Processes digital information in analog form; or
„ Both
„ Mixed Signal Device
! b# B, j6 I9 n1 T„ Operates across digital and analog domains by representing
or processing either analog or digital information in either
8 w+ Z: W/ `6 l& g/ x+ Nanalog or digital form

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