|
|
EDA365欢迎您登录！
您需要 登录 才可以下载或查看，没有帐号？注册
x
混合信号测量* ~+ i+ a0 A& J" H
9 f. g( l/ i8 G. \3 R3 n内容并不限于混合信号系统测试，而是一般芯片或模块测试的全过程，只是以ADC和DAC为例说明芯片外特性测试的全过程。本章更多地是讲测试中的数据处理方法，间或涉及到测试电路
0 a9 c6 U- S7 ?7 p$ P2 g) x( d3 i4 g
„ I. What is Mixed Signal
# [: c5 N& O* d h' X„ II. Mixed Signal Test Parameters
; ~1 u7 q9 P& \9 A$ _„ III. Signal Generation
% W' D8 m; X* t- @: _„ IV. Signal Capture0 P0 g" ~- z: |0 J: ]) }/ w! l7 J6 k
„ V. Fast Fourier Transform
: y5 W& h% N- O„ VI. Testing Digital-to-Analog Converters7 i0 N* c( w) o2 n) a) b4 {
„ VII. Testing Analog-to-Digital Converters8 q) H! ~/ ^" `3 [
- q9 q9 _/ \- y$ a% g„ Music CD
+ H, L. H8 c3 y1 {& A1 D* Q„ Analog information is processed in digital form6 R/ o. y( F+ I9 K( C
„ Modem! l1 r* U: g7 q* @
„ Digital information is processed in analog form6 O; I: g3 ?4 G" |" J; a' _
„ Mixed Signal System m, i' ~ F& M" C/ a1 e/ I- X
„ Processes analog information in digital form; or
0 A( k0 \1 h: y h„ Processes digital information in analog form; or
9 j# f4 b, J3 {' U„ Both
8 r" Y8 z* m0 r6 M+ p2 j„ Mixed Signal Device9 i& E* {$ j6 ]# M+ k
„ Operates across digital and analog domains by representing # t. U5 Z1 W* W5 ?) F" [
or processing either analog or digital information in either
/ `' z3 n, x/ k% Nanalog or digital form
- d! X+ i6 J$ E) A3 P7 r6 f+ a$ q+ w% a$ [, U! e
6 @8 A- V3 e) G' x6 ]$ Z+ I1 I3 k; `; p
4 C$ \7 o7 P0 X' Z5 L" N |
|
/1 
发表于 2019-11-26 15:06
收藏
淘帖
支持！
反对！