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混合信号测量
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内容并不限于混合信号系统测试，而是一般芯片或模块测试的全过程，只是以ADC和DAC为例说明芯片外特性测试的全过程。本章更多地是讲测试中的数据处理方法，间或涉及到测试电路
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( r$ W$ w i4 a( B8 f& u' L% _„ I. What is Mixed Signal
- [$ }; x1 w' ~5 w„ II. Mixed Signal Test Parameters
$ p- [: w. l1 t' J7 \0 U„ III. Signal Generation# |% ~; M0 D- E; X3 X/ D2 }' E0 c
„ IV. Signal Capture
3 N* Z* x. r' O6 h; p: k* w0 E„ V. Fast Fourier Transform5 n4 x W0 a. s
„ VI. Testing Digital-to-Analog Converters
v& L" l& u% i9 {$ p7 X/ d B/ V- P„ VII. Testing Analog-to-Digital Converters% X" J( x6 ]9 E; p S4 @/ D, W
* ~$ j- f1 ~6 k) ]„ Music CD
, w; I5 i2 W; A( {„ Analog information is processed in digital form
; W# [+ ]- O0 B4 A„ Modem
f# f" I0 U) l9 L! M5 y„ Digital information is processed in analog form9 s) b3 E4 u: Q* H- P' c
„ Mixed Signal System% ~& A7 X. g# _. H! S
„ Processes analog information in digital form; or2 |- I1 L! [9 H4 c, p" i
„ Processes digital information in analog form; or% g; [! K2 S: o1 e; ]7 n0 u- T
„ Both9 u, x: i) |: H. t' c9 [0 p
„ Mixed Signal Device1 w* l6 ?' N* i6 F$ i- j( W
„ Operates across digital and analog domains by representing
`, W# \( Z aor processing either analog or digital information in either
( c. h p3 T* y4 E6 x) qanalog or digital form
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发表于 2019-11-26 15:06
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淘帖
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反对！