TA的每日心情 | 开心 2024-9-14 15:26 |
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发表于 2015-12-15 11:50
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micdot 发表于 2015-12-15 11:40
5 |: U% F0 |' [6 K0 E- W o) D/ `压敏电阻不能做到的事:
- H) H# G5 `0 |/ r8 t8 ~" A$ j一些人以为突波吸收装置里的压敏电阻可以提供完整的电压保护,但不幸的是,压敏电 ... 1 N, O2 f( J& [! @9 R$ a9 ?% [* M/ Q
谢谢,我还碰到插拔USB导致PMU烧毁的情况,厂商分析为EOS原因:8 O |, {; W+ h" M3 Q
(1) By ATE test program, short failure was detected on these returned samples.
0 C/ R( P, \0 B(2) From X-ray analysis, no obvious abnormality was observed on these samples.: b$ \1 g% n9 \+ d- K4 E
(3) From de-cap analysis, obvious chip burned was observed on these samples. t8 P7 ?2 e! |, [- `1 A
(4) Based on above analysis, we think EOS could be the root cause to result in chip damaged of these returned samples.
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